From: "Richard Schwartz" 
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Reply-To: "Richard Schwartz" 



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Sent: Thursday, September 05, 2002 11:55 AM Subject: Web of Science Records


>
> Notes: attached is search for Ronchi papers
>
> ============================================================
> Copyright C 2002 Institute for Scientific Information
>
> FN ISI Export Format
> VR 1.0
> PT Journal
> AU Cordero-Davila, A
>    Nunez-Alfonso, JM
>    Luna-Aguilar, E
>    Robledo-Sanchez, CI
> TI Only one fitting for bironchigrams
> SO APPLIED OPTICS
> NR 15
> CR CORDERO A, 1995, 9502 UNAM I ASTR
>    CORDERODAVILA A, 1998, APPL OPTICS, V37, P672
>    CORDERODAVILA A, 1998, APPL OPTICS, V37, P7983
>    CORDERODAVILA A, 1994, APPL OPTICS, V33, P7339
>    CORDERODAVILA A, 1994, APPL OPTICS, V33, P7343
>    JEFFERYS WH, 1980, AJ, V85, P177
>    JEFFERYS WH, 1981, ASTRON J, V86, P149
>    MALACARA D, OPTICAL SHOP TESTING, PCH13
>    MEYERS WS, 1993, FABRICATION TESTING, V1994, P90
>    MEYERS WS, 1992, INTERFEROMETRY TECHN, V1755, P84
>    RONCHI V, 1964, APPL OPTICS, V3, P437
>    RONCHI V, 1923, RIV OTTICA MECC PREC, V2, P9
>    SALAS L, 1997, APPL OPTICS, V36, P3708
>    SALAS L, 1996, APPL OPTICS, V35, P1593
>    STULTZ K, 1994, P SOC PHOTO-OPT INS, V2263, P226
> BP 5600
> EP 5609
> PG 10
> JI Appl. Optics
> PY 2001
> PD NOV 1
> VL 40
> IS 31
> GA 487BH
> J9 APPL OPT
> UT ISI:000171853400006
> ER
>
> PT Journal
> AU Nunez-Alfonso, JM
>    Cordero-Davila, A
>    Vergara-Limon, S
>    Cuautle-Cortes, J
> TI Improved Ronchi tester
> SO APPLIED OPTICS
> NR 8
> CR CABRERAPALAEZ VH, 2000, THESIS BENEMERITA U
>    CORNEJORODRIGUE.A, 1992, OPTICAL SHOP TESTING, PCH9
>    DIAZANZURES J, 1998, THESIS BENEMERITA U
>    LEE HJ, 1999, OPT ENG, V38, P1041
>    MALVINO AP, 1979, ELECT PRINCIPLES, PCH4
>    OMURA K, 1988, APPL OPTICS, V27, P523
>    PATORSKY K, 1986, APPL OPTICS, V25, P2031
>    SCHUMACHER ER, 1966, APPL OPTICS, V5, P475
> BP 501
> EP 505
> PG 5
> JI Appl. Optics
> PY 2001
> PD FEB 1
> VL 40
> IS 4
> GA 396QF
> J9 APPL OPT
> UT ISI:000166647500010
> ER
>
> PT Journal
> AU Royo, S
>    Arasa, J
>    Pizarro, C
> TI Profilometry of toroidal surfaces with an improved Ronchi test
> SO APPLIED OPTICS
> NR 17
> CR ARASA J, 1998, P SOC PHOTO-OPT INS, V3491, P909
>    CARRETERO L, 1993, APPL OPTICS, V32, P4132
>    CORDERODAVILA A, 1998, APPL OPTICS, V37, P672
>    CORDERODAVILA A, 1992, APPL OPTICS, V31, P2370
>    CORDERODAVILA A, 1990, APPL OPTICS, V29, P4618
>    CORNEJORODRIGUE.A, 1992, OTPICAL SHOP TESTING
>    HIBINO K, 1997, APPL OPTICS, V36, P6178
>    JALIE M, 1980, PRINCIPLES OPHTHALMI
>    LEE HJ, 1999, OPT ENG, V38, P1041
>    MALACARA D, 1974, APPL OPTICS, V13, P1778
>    MENCHACA C, 1986, APPL OPTICS, V25, P3008
>    MEYERS W, 1992, P SOC PHOTO-OPT INS, V1755, P84
>    MOBSBY E, 1974, SKY TELESCOPE, V48, P325
>    OMURA K, 1988, APPL OPTICS, V27, P523
>    ROYO S, 1999, THESIS TU CATALONIA
>    STULTZ K, 1994, P SOC PHOTO-OPT INS, V2263, P226
>    WAN DS, 1993, OPT ENG, V32, P1084
> BP 5721
> EP 5731
> PG 11
> JI Appl. Optics
> PY 2000
> PD NOV 1
> VL 39
> IS 31
> GA 369EJ
> J9 APPL OPT
> UT ISI:000165052800009
> ER
>
> PT Journal
> AU Lopez-Ramirez, JM
>    Malacara-Doblado, D
>    Malacara-Hernandez, D
> TI New simple geometrical test for aspheric lenses and mirrors
> SO OPTICAL ENGINEERING
> NR 3
> CR ADACHI I, 1962, ATTI FOND GIORGIO RO, V17, P252
>    CORNEJO A, 1970, APPL OPTICS, V9, P1897
>    CORNEJO A, 1992, OPTICAL SHOP TESTING
> BP 2143
> EP 2148
> PG 6
> JI Opt. Eng.
> PY 2000
> PD AUG
> VL 39
> IS 8
> GA 344AD
> J9 OPT ENG
> UT ISI:000088734700019
> ER
>
> PT Journal
> AU Forkner, JF
> TI Computer generation of null masks for Ronchi lens tests
> SO OPTICAL ENGINEERING
> NR 4
> CR ANDERSON JH, 1929, ASTROPHYS J, V70, P175
>    KING JH, 1934, J OPT SOC AM     SEP
>    RONCHI V, 1925, PROVI SISTEMI OTTICA
>    STRONG J, 1945, PROCEDURES EXPT PHYS, P77
> BP 1840
> EP 1844
> PG 5
> JI Opt. Eng.
> PY 2000
> PD JUL
> VL 39
> IS 7
> GA 334YJ
> J9 OPT ENG
> UT ISI:000088213800015
> ER
>
> PT Journal
> AU Wagemann, EU
>    Haist, T
>    Schonleber, M
>    Tiziani, HJ
> TI Fast shape and position control by Moire-filtering and object-
>    adapted fringe projection
> SO OPTICS COMMUNICATIONS
> NR 9
> CR HAIST T, 1999, P SPIE, V3823
>    HARTHONG J, 1983, CR HEBD ACAD SCI, V296, P39
>    KALMS MK, 1997, P SOC PHOTO-OPT INS, V3407, P483
>    LOHMANN AW, 1980, OPT COMMUN, V34, P167
>    PATORSKI K, 1993, MOIRE FRINGE TECHNIQ
>    SCHONLEBER M, 1998, 31 P ISATA
>    SCHONLEBER M, 1997, P SOC PHOTO-OPT INS, V3098, P35
>    WAGEMANN EU, 1998, OPT LETT, V23, P1621
>    YATAGAI T, 1977, OPT COMMUN, V20, P243
> BP 7
> EP 10
> PG 4
> JI Opt. Commun.
> PY 1999
> PD JUL 1
> VL 165
> IS 1-3
> GA 212KF
> J9 OPT COMMUN
> UT ISI:000081215300002
> ER
>
> PT Journal
> AU Lee, HJ
>    Kim, SW
> TI Precision profile measurement of aspheric surfaces by improved
>    Ronchi test
> SO OPTICAL ENGINEERING
> NR 12
> CR BARAKAT, 1969, J OPT SOC AM, V59, P1432
>    CORDERODAVILA A, 1992, APPL OPTICS, V31, P2370
>    CORDERODAVILA A, 1990, APPL OPTICS, V29, P4618
>    CORNEJORODRIGUE.A, 1992, OPTICAL SHOP TESTING, PCH9
>    GASVIK KJ, 1995, OPTICAL METROLOGY, PCH4
>    HIBINO K, 1997, APPL OPTICS, V36, P6178
>    HUDGIN RH, 1977, J OPT SOC AM, V67, P375
>    MALACARA D, 1965, APPL OPTICS, V4, P1371
>    OMURA K, 1988, APPL OPTICS, V27, P523
>    SERVIN M, 1996, APPL OPTICS, V35, P4343
>    SOUTHWELL WH, 1980, J OPT SOC AM, V70, P998
>    VANDERLUGT A, 1992, OPTICAL IMAGE PROCES, PCH3
> BP 1041
> EP 1047
> PG 7
> JI Opt. Eng.
> PY 1999
> PD JUN
> VL 38
> IS 6
> GA 204BA
> J9 OPT ENG
> UT ISI:000080742000016
> ER
>
> PT Journal
> AU Braat, J
>    Janssen, AJEM
> TI Improved Ronchi test with extended source
> SO JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE
>    SCIENCE AND VISION
> NR 12
> CR ABAMOWITZ M, 1970, HDB MATH FUNCTIONS
>    ARKFEN G, 1985, MATH METHODS PHYSICI
>    BARAKAT R, 1969, J OPT SOC AM, V59, P1432
>    BORN M, 1980, PRINCIPLES OPTICS
>    CORNEJORODRIGUE.A, 1992, OPTICAL SHOP TESTING, P321
>    CREATH K, 1992, OPTICAL SHOP TESTING, P637
>    GROEBNER W, 1973, INTEGRALTAFEL, V2
>    LEIBBRANDT GWR, 1996, APPL OPTICS, V35, P6151
>    MALACARA D, 1965, APPL OPTICS, V4, P1371
>    RONCHI V, 1964, APPL OPTICS, V3, P437
>    SCHWIDER J, 1981, APPL OPTICS, V20, P2635
>    TORALDO G, 1954, OPTICAL IMAGE EVALUA
> BP 131
> EP 140
> PG 10
> JI J. Opt. Soc. Am. A-Opt. Image Sci. Vis.
> PY 1999
> PD JAN
> VL 16
> IS 1
> GA 153MX
> J9 J OPT SOC AM A-OPT IMAGE SCI
> UT ISI:000077837800013
> ER
>
> PT Journal
> AU Arriaga, LT
>    Davila, AC
> TI Simulation of ronchigrams for lenses with toric surfaces
> SO REVISTA MEXICANA DE FISICA
> NR 8
> CR ARRIAGA LT, 1995, TESIS LICENCIATURA
>    CORDERODAVILA A, 1992, APPL OPTICS, V31, P2370
>    CORDONA NO, 1987, APPL OPTICS, V26, P4832
>    KUROSCH AG, 1995, CURSO ALGEBRA SUPERI
>    MALACARA D, 1971, APPL OPTICS, V10, P679
>    RODRIGUEZ AC, 1992, OPTICA SHOP TESTING, PCH9
>    SPENCER GH, 1962, J OPT SOC AM, V52, P672
>    VILENKIN NY, 1978, METODO APROXIMACIONE
> BP 570
> EP 574
> PG 5
> JI Rev. Mex. Fis.
> PY 1998
> PD DEC
> VL 44
> IS 6
> GA 148XN
> J9 REV MEX FIS
> UT ISI:000077559700007
> ER
>
> PT Journal
> AU Cordero-Davila, A
>    Luna-Aguilar, E
>    Vazquez-Montiel, S
>    Zarate-VAzquez, S
>    Percino-Zacarias, ME
> TI Ronchi test with a square grid
> SO APPLIED OPTICS
> NR 18
> CR BRUSCAGLIONI R, 1932, REAND ACCAD NAZ LINC, V15, P70
>    CORDERO A, 1995, RT9502 IAUNAM
>    CORDERODAVILA A, 1992, APPL OPTICS, V31, P2370
>    CORNEJORODRIGUE.A, 1976, B I TONANTZINTLA, V2, P127
>    CORNEJORODRIGUE.A, 1992, OPTICAL SHOP TESTING, P321
>    DUTTON D, 1968, APPL OPTICS, V7, P125
>    FREISCHLAD KR, 1986, J OPT SOC AM A, V3, P1852
>    GHOZEIL I, 1992, OPTICAL SHOP TESTING, P367
>    HARBERS G, 1996, APPL OPTICS, V35, P6162
>    KOLIOPOULOS CL, 1980, APPL OPTICS, V19, P1523
>    LEIBBRANDT GWR, 1996, APPL OPTICS, V35, P6151
>    MALACARA D, 1992, OPTICAL SHOP TESTING, P455
>    MEYERS W, 1992, P SOC PHOTO-OPT INS, V1755, P84
>    RAYCES JL, 1964, OPT ACTA, V11, P85
>    RIMMER MP, 1974, APPL OPTICS, V13, P623
>    STAHL HP, 1995, P SOC PHOTO-OPT INS, V2546, P167
>    STULTZ K, 1994, P SOC PHOTO-OPT INS, V2263, P226
>    WYANT JC, 1973, APPL OPTICS, V12, P2057
> BP 672
> EP 675
> PG 4
> JI Appl. Optics
> PY 1998
> PD FEB 1
> VL 37
> IS 4
> GA YV841
> J9 APPL OPT
> UT ISI:000071868700010
> ER
>
> PT Journal
> AU Hibino, K
>    Farrant, DI
>    Ward, BK
>    Oreb, BF
> TI Dynamic range of Ronchi test with a phase-shifted sinusoidal
>    grating
> SO APPLIED OPTICS
> NR 19
> CR BRUNING JH, 1974, APPL OPTICS, V13, P2693
>    CARRETERO L, 1993, APPL OPTICS, V32, P4132
>    CORNEJO A, 1970, APPL OPTICS, V9, P1897
>    CORNEJORODRIGUE.A, 1978, OPTICAL SHOP TESTING, P283
>    CUBALCHINI R, 1979, J OPT SOC AM, V69, P972
>    FREISCHLAD KR, 1986, J OPT SOC AM A, V3, P1852
>    FRIED DL, 1977, J OPT SOC AM, V67, P370
>    HARIHARAN P, 1984, OPT ACTA, V31, P989
>    HEGEDUS ZS, 1993, APPL OPTICS, V32, P2285
>    KASANA RS, 1984, OPT LASER TECHNOL, V23, P101
>    LARKIN KG, 1992, J OPT SOC AM A, V9, P1740
>    MEYERS WS, 1992, 36 ANN S INT SOC OPT, V1755, P84
>    OMURA K, 1988, APPL OPTICS, V27, P523
>    STETSON KA, 1985, APPL OPTICS, V24, P3631
>    TAKAJO H, 1988, J OPT SOC AM A, V5, P416
>    WAN DS, 1990, APPL OPTICS, V29, P3255
>    WINGERDEN JV, 1991, APPL OPTICS, V30, P2718
>    WYANT JC, 1975, APPL OPTICS, V14, P2622
>    YATAGAI T, 1984, APPL OPTICS, V23, P3676
> BP 6178
> EP 6189
> PG 12
> JI Appl. Optics
> PY 1997
> PD SEP 1
> VL 36
> IS 25
> GA XT925
> J9 APPL OPT
> UT ISI:A1997XT92500002
> ER
>
> PT Journal
> AU Gonzalez, C
>    Villegas, ER
>    Carretero, L
>    Fimia, A
> TI Ronchi test for testing the powers of bifocal intraocular
>    lenses
> SO OPHTHALMIC AND PHYSIOLOGICAL OPTICS
> NR 7
> CR *ANSI, 1984, Z8071984 ANSI
>    CARRETERO L, 1993, APPL OPTICS, V32, P4132
>    CARRETERO L, 1992, OPTOMETRY VISION SCI, V69, P190
>    MALACARA D, 1978, OPTICAL SHOP TESTING, P283
>    NEUBERT WJ, 1993, SPIE, V1877
>    ROL P, 1991, SPIE, V1423
>    SILBERMAN D, 1991, SPIE, V1423
> BP 161
> EP 163
> PG 3
> JI Ophthalmic Physiol. Opt.
> PY 1997
> PD MAR
> VL 17
> IS 2
> GA WP930
> J9 OPHTHALMIC PHYSL OPT
> UT ISI:A1997WP93000012
> ER
>
> PT Journal
> AU BLAKLEY, R
> TI TESTING CONCAVE SURFACES WITH A ROTATING RONCHI GRATING
> SO OPTICAL ENGINEERING
> NR 8
> CR EVEREST AW, 1972, AMATEUR TELESCOPE MA, P21
>    INGALLS AG, 1972, AMATEUR TELESCOPE MA, P108
>    KING JH, 1972, AMATEUR TELESCOPE MA, P104
>    KIRKHAM AR, 1974, AMATEUR TELESCOPE MA, P264
>    MAGEE RJ, 1974, SKY TELESCOPE, P184
>    MOBSBY EGH, 1974, SKY TELESCOPE, P325
>    TEREBIZH VY, 1974, SKY TELESCOPE, P312
>    TEREBIZH VY, 1974, SKY TELESCOPE, P316
> BP 3472
> EP 3475
> PG 4
> JI Opt. Eng.
> PY 1994
> PD OCT
> VL 33
> IS 10
> GA PM148
> J9 OPT ENG
> UT ISI:A1994PM14800045
> ER
>
> PT Journal
> AU CARRETERO, L
>    GONZALEZ, C
>    FIMIA, A
>    PASCUAL, I
> TI APPLICATION OF THE RONCHI TEST TO INTRAOCULAR LENSES - A
>    COMPARISON OF THEORETICAL AND MEASURED RESULTS
> SO APPLIED OPTICS
> NR 13
> CR ATCHISON DA, 1989, OPTOMETRY VISION SCI, V66, P146
>    ATCHISON DA, 1989, OPTOMETRY VISION SCI, V66, P492
>    ATCHISON DA, 1989, OPTOMETRY VISION SCI, V66, P579
>    ATCHISON DA, 1989, OPTOMETRY VISION SCI, V66, P671
>    AURAN JD, 1990, ARCH OPHTHALMOL-CHIC, V108, P75
>    BARAKAT R, 1969, J OPT SOC AM, V59, P1432
>    CARRETERO L, 1992, OPTOMETRY VISION SCI, V69, P190
>    CARRETERO L, 1991, P SOC PHOTOOPT INSTR, V1507, P458
>    FIMIA A, 1993, J CATARACT REFR SURG, V19, P293
>    JENKINS FA, 1976, FUNDAMENTALS OPTICS, PCH9
>    MAHAJAN VN, 1991, ABERRATION THEORY MA, PCH12
>    MALACARA D, 1978, OPTICAL SHOP TESTING
>    WELFORD WT, 1986, ABERRATION OPTICAL S, PCH8
> BP 4132
> EP 4137
> PG 6
> JI Appl. Optics
> PY 1993
> PD AUG 1
> VL 32
> IS 22
> GA LP433
> J9 APPL OPT
> UT ISI:A1993LP43300005
> ER
>
> PT Journal
> AU WAN, DS
>    CHANG, MW
> TI EFFECTS OF GRATING SPACING ON THE RONCHI TEST
> SO OPTICAL ENGINEERING
> NR 7
> CR CORNEJORODRIGUEZ A, 1978, OPTICAL SHOP TESTING, P304
>    FRESCHALD K, 1986, J OPT SOC AM A, V3, P1852
>    GASKILL JD, 1978, LINEAR SYSTEMS FOURI, P449
>    HARIHARAN P, 1987, APPL OPTICS, V26, P2504
>    OMURA K, 1988, APPL OPTICS, V27, P523
>    RIMMER MP, 1974, APPL OPTICS, V13, P623
>    WAN DS, 1990, APPL OPTICS, V29, P3255
> BP 1084
> EP 1090
> PG 7
> JI Opt. Eng.
> PY 1993
> PD MAY
> VL 32
> IS 5
> GA LA940
> J9 OPT ENG
> UT ISI:A1993LA94000027
> ER
>
> PT Journal
> AU RODRIGUEZ, AC
>    DAVILA, AC
>    NUNEZ, OC
> TI TESTING WITH SLOPE MEASURING METHODS - A REVIEW
> SO REVISTA MEXICANA DE FISICA
> NR 12
> CR CORDERO A, IN PRESS APPL OPTICS
>    CORDERODAVILA A, 1990, APPL OPTICS, V29, P4618
>    FOUCAULT LM, 1858, CR HEBD ACAD SCI, V47, P958
>    HARTMANN J, 1900, ZT INSTRUMENT ENKD, V20, P47
>    MALACARA D, 1975, APPL OPTICS, V14, P1065
>    MALACARA D, 1974, APPL OPTICS, V13, P1778
>    MALACARA D, 1978, OPTICAL SHOP TESTING
>    MEINEL AB, 1968, OPT SC NEWSLETT, V2, P134
>    RAYCES JL, 1964, OPT ACTA, V11, P85
>    RONCHI V, 1923, RIV OTTICA MECC PREC, V2, P9
>    SMITH W, 1966, MODERN OPTICAL ENG
>    SOUTHWELL WH, 1980, J OPT SOC AM, V70, P998
> BP 295
> EP 299
> PG 5
> JI Rev. Mex. Fis.
> PY 1992
> PD SEP
> VL 38
> SU 1
> GA JX474
> J9 REV MEX FIS
> UT ISI:A1992JX47400036
> ER
>
> PT Journal
> AU LUNAAGUILAR, E
>    CORNEJORODRIGUEZ, A
>    CORDERODAVILA, A
> TI RONCHI-HARTMANN NULL TEST
> SO REVISTA MEXICANA DE FISICA
> NR 6
> CR CORDERODAVILA A, 1990, APPL OPTICS, V29, P4618
>    GOODMAN JW, 1968, INTRO FOURIER OPTICS, PCH4
>    LOHMANN AW, 1978, OPTICAL INFORMATION
>    LUNA E, 1991, THESIS INAOE
>    MENDENHALL W, 1986, ESTADISTICA MATEMATI
>    VITRICHENKO EA, 1976, SOV J OPT TECHNOL, V20, P373
> BP 150
> EP 161
> PG 12
> JI Rev. Mex. Fis.
> PY 1992
> PD FEB
> VL 38
> IS 1
> GA JB344
> J9 REV MEX FIS
> UT ISI:A1992JB34400012
> ER
>
> PT Journal
> AU CARRETERO, L
>    FUENTES, R
>    FIMIA, A
> TI MEASUREMENT OF SPHERICAL-ABERRATION OF INTRAOCULAR LENSES WITH
>    THE RONCHI TEST
> SO OPTOMETRY AND VISION SCIENCE
> NR 0
> BP 190
> EP 192
> PG 3
> JI Optom. Vis. Sci.
> PY 1992
> PD MAR
> VL 69
> IS 3
> GA HJ292
> J9 OPTOMETRY VISION SCI
> UT ISI:A1992HJ29200005
> ER
>
> PT Journal
> AU LIN, JA
>    JANG, H
> TI DOUBLE GRATING INTERFEROMETER WITH INCOHERENT ILLUMINATION
> SO OPTIK
> NR 23
> CR ANDERSON JH, 1929, ASTROPHYS J, V70, P175
>    BARTELT HO, 1983, OPT COMMUN, V48, P1
>    BARTELT HO, 1979, OPT COMMUN, V30, P268
>    BOLOGNINI N, 1985, OPT ACTA, V32, P409
>    BRENNER KH, 1983, OPT COMMUN, V46, P14
>    CARTWRIGHT S, 1986, APPL OPTICS, V25, P3141
>    COLAUTTI C, 1988, OPT LETT, V13, P1069
>    GORI F, 1979, OPT COMMUN, V31, P4
>    JAHNS J, 1979, OPT COMMUN, V28, P263
>    LAU E, 1948, ANN PHYS, V6, P417
>    LIN JA, 1990, APPL OPTICS, V29, P1912
>    LIN JA, IN PRESS APPL OPT
>    LIN JA, 1990, OPTIK, V84, P28
>    LIU L, 1988, J MOD OPTIC, V35, P1605
>    MANDEL L, 1976, J OPT SOC AM, V66, P259
>    MURTY MVR, 1973, APPL OPTICS, V12, P2230
>    PATORSKI K, 1986, APPL OPTICS, V25, P2790
>    PATORSKI K, 1983, OPT ACTA, V30, P745
>    SETHURAMAN J, 1985, OPT COMMUN, V52, P377
>    SHOVGENYUK MV, 1986, OPT SPEKTROSK+, V61, P821
>    SUDOL R, 1979, OPT COMMUN, V31, P105
>    SUDOL R, 1981, THESIS U ROCHESTER
>    SWANSON GJ, 1982, J OPT SOC AM, V72, P552
> BP 67
> EP 72
> PG 6
> JI Optik
> PY 1990
> PD NOV
> VL 86
> IS 2
> GA EN694
> J9 OPTIK
> UT ISI:A1990EN69400007
> ER
>
> PT Journal
> AU MALACARA, D
> TI ANALYSIS OF THE INTERFEROMETRIC RONCHI TEST
> SO APPLIED OPTICS
> NR 2
> CR CORNEJORODRIGUE.A, 1978, OPTICAL SHOP TESTING, P283
>    MALACARA D, 1974, B I TONANTZINTLA, V1, P193
> BP 3633
> EP 3637
> PG 5
> JI Appl. Optics
> PY 1990
> PD SEP 1
> VL 29
> IS 25
> GA DY133
> J9 APPL OPT
> UT ISI:A1990DY13300013
> ER
>
> PT Journal
> AU WAN, DS
>    LIN, DT
> TI RONCHI TEST AND A NEW PHASE REDUCTION ALGORITHM
> SO APPLIED OPTICS
> NR 8
> CR ANGEL R, 1987, COMMUNICATION
>    ANGEL R, 1986, WORKSHOP OPTICAL FAB
>    CORNEJORODRIGUE.A, 1978, OPTICAL SHOP TESTING, P311
>    GASKILL J, 1978, LINEAR SYSTEMS FOURI, P60
>    OMURA K, 1988, APPL OPTICS, V27, P523
>    TOYOOKA S, 1984, OPT COMMUN, V51, P68
>    WAN DS, 1987, THESIS U ARIZONA
>    YATAGAI T, 1984, APPL OPTICS, V23, P3676
> BP 3255
> EP 3265
> PG 11
> JI Appl. Optics
> PY 1990
> PD AUG 1
> VL 29
> IS 22
> GA DR844
> J9 APPL OPT
> UT ISI:A1990DR84400012
> ER
>
> PT Journal
> AU LIN, JA
>    HSU, J
>    SHIUE, SG
> TI QUANTITATIVE 3-BEAM RONCHI TEST
> SO APPLIED OPTICS
> NR 14
> CR BRIERS JD, 1979, OPT LASER TECHNOL, V11, P189
>    BRIERS JD, 1979, OPT LASER TECHNOL, V11, P245
>    COHENSABBAN Y, 1983, J OPT SOC AM, V73, P707
>    CORNEJORODRIGUE.A, 1978, OPTICAL SHOP TESTING
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>    KOMISSARUK VA, 1964, OPT SPEKTROSK+, V16, P571
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>    LIN JA, 1986, ULTRAMICROSCOPY, V19, P31
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>    YATAGAI T, 1984, APPL OPTICS, V23, P3676
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> BP 1912
> EP 1918
> PG 7
> JI Appl. Optics
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> PD MAY 1
> VL 29
> IS 13
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> J9 APPL OPT
> UT ISI:A1990DB97000018
> ER
>
> PT Journal
> AU OMURA, K
>    YATAGAI, T
> TI PHASE MEASURING RONCHI TEST
> SO APPLIED OPTICS
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> CR BRUNING JH, 1974, APPL OPTICS, V13, P2693
>    CORENJO A, 1978, OPTICAL SHOP TESTING, P283
>    KOLIOPOULOS CL, 1980, APPL OPTICS, V19, P1523
>    MACGOVERN AJ, 1971, APPL OPTICS, V10, P619
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>    MURTY MVK, 1978, OPTICAL SHOP TESTING, P81
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>    RIMMER MP, 1974, APPL OPTICS, V13, P623
>    WYANT JC, 1975, APPL OPTICS, V14, P2622
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>    WYANT JC, 1972, APPL OPTICS, V11, P2833
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>    YATAGAI T, 1978, APPL OPTICS, V17, P558
>    YATAGAI T, IN PRESS
>    YATAGAI T, 1984, OPT ENG, V23, P357
> BP 523
> EP 528
> PG 6
> JI Appl. Optics
> PY 1988
> PD FEB 1
> VL 27
> IS 3
> GA M0311
> J9 APPL OPT
> UT ISI:A1988M031100024
> ER
>
> PT Journal
> AU PATORSKI, K
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> SO APPLIED OPTICS
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> CR ANDERSON JH, 1929, ASTROPHYS J, V70, P175
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>    PATORSKI K, 1984, OPT ACTA, V31, P33
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> BP 3009
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> PG 2
> JI Appl. Optics
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> PD SEP 15
> VL 25
> IS 18
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> UT ISI:A1986E036700004
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>
> PT Journal
> AU PATORSKI, K
>    CORNEJORODRIGUEZ, A
> TI FRINGE CONTRAST INTERPRETATION FOR AN EXTENDED SOURCE RONCHI
>    TEST
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> CR BARTELT HO, 1979, OPT COMMUN, V30, P268
>    BOLOGNINI N, 1985, OPT ACTA, V32, P409
>    BRIERS JD, 1979, OPT LASER TECHNOL, V11, P189
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> BP 2790
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> VL 25
> IS 16
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> J9 APPL OPT
> UT ISI:A1986D632800030
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>
> PT Journal
> AU PATORSKI, K
>    CORNEJORODRIGUEZ, A
> TI RONCHI TEST WITH DAYLIGHT ILLUMINATION
> SO APPLIED OPTICS
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> BP 2031
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> PG 2
> JI Appl. Optics
> PY 1986
> PD JUL 1
> VL 25
> IS 13
> GA D0471
> J9 APPL OPT
> UT ISI:A1986D047100001
> ER
>
> PT Journal
> AU PATORSKI, K
>    SALBUT, L
> TI REVERSED PATH RONCHI TEST
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> VL 14
> IS 2
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> J9 OPT APPL
> UT ISI:A1984TP00900013
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>
> PT Journal
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> TI FRINGE SCANNING RONCHI TEST FOR ASPHERICAL SURFACES
> SO APPLIED OPTICS
> NR 10
> CR BRUNING JH, 1974, APPL OPTICS, V13, P2693
>    CORNEJORODRIGUE.A, 1978, OPTICAL SHOP TESTING, P283
>    MACGOVERN AJ, 1971, APPL OPTICS, V10, P619
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> IS 20
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> J9 APPL OPT
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> ER
>
> PT Journal
> AU SCHULTZ, SW
> TI STANDARDIZING THE RONCHI TEST PATTERN
> SO SKY AND TELESCOPE
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> IS 3
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> UT ISI:A1984SE21400025
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> PT Journal
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>    BORN M, 1964, PRINCIPLES OPTICS
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> BP 2635
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> VL 20
> IS 15
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> UT ISI:A1981MA32100015
> ER
>
> PT Journal
> AU BRIERS, JD
>    COCHRANE, DMJ
> TI RONCHI TEST FORMULAS .2. PRACTICAL FORMULAS AND EXPERIMENTAL-
>    VERIFICATION
> SO OPTICS AND LASER TECHNOLOGY
> NR 0
> BP 245
> EP 257
> PG 13
> JI Opt. Laser Technol.
> PY 1979
> VL 11
> IS 5
> GA HR473
> J9 OPT LASER TECHNOL
> UT ISI:A1979HR47300001
> ER
>
> PT Journal
> AU BRIERS, JD
> TI RONCHI TEST FORMULAS .1. THEORY
> SO OPTICS AND LASER TECHNOLOGY
> NR 0
> BP 189
> EP 196
> PG 8
> JI Opt. Laser Technol.
> PY 1979
> VL 11
> IS 4
> GA HH719
> J9 OPT LASER TECHNOL
> UT ISI:A1979HH71900002
> ER
>
> PT Journal
> AU CORNEJORODRIGUEZ, A
> TI SHARPENING FRINGES IN RONCHI TEST .2.
> SO JOURNAL OF THE OPTICAL SOCIETY OF AMERICA
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> CR KATYL RH, 1972, APPL OPTICS, V11, P2278
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> UT ISI:A1978FS96800338
> ER
>
> PT Journal
> AU MALACARA, D
>    JOSSE, M
> TI TESTING OF ASPHERICAL LENSES USING SIDE BAND RONCHI TEST
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> CR MALACARA D, 1976, APPL OPT, V15, P2220
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> VL 17
> IS 1
> GA EG051
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> UT ISI:A1978EG05100011
> ER
>
> PT Journal
> AU MALACARA, D
>    CORNEJO, A
> TI SIDE BAND RONCHI TEST
> SO APPLIED OPTICS
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> CR CORNEJO A, 1970, APPL OPTICS, V9, P1897
>    MURTY MVR, 1973, APPL OPTICS, V12, P2230
>    MURTY MVR, 1966, APPL OPTICS, V5, P323
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>    TORALDODIFRANCI.G, 1954, NBS256 CIRC
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> VL 15
> IS 9
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> UT ISI:A1976CB91800051
> ER
>
> PT Journal
> AU FELLGETT, PB
>    GEE, AE
> TI NULL RONCHI TEST FOR ASPHERICAL SURFACES - COMMENT
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> CR MALACARA D, 1974, APPL OPTICS, V13, P1778
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> VL 14
> IS 2
> GA V5031
> J9 APPL OPT
> UT ISI:A1975V503100024
> ER
>
> PT Journal
> AU MALACARA, D
>    CORNEJO, A
> TI NULL RONCHI TEST FOR ASPHERICAL SURFACES - REPLY
> SO APPLIED OPTICS
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>    MALACARA D, 1974, APPL OPTICS, V13, P1778
>    PASTOR J, 1969, APPL OPTICS, V8, P525
> BP 279
> EP 279
> PG 1
> JI Appl. Optics
> PY 1975
> VL 14
> IS 2
> GA V5031
> J9 APPL OPT
> UT ISI:A1975V503100025
> ER
>

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